Monday, August 17, 2015

Real-time monitoring of oxidative etching on single Ag nanocube via light-scattering dark-field microscopic imaging

Nanoscale, 2015, Accepted Manuscript
DOI: 10.1039/C5NR04234H, Paper
Yi Wang, Hong Yan Zou, Cheng Zhi Huang
A low-cost and easy-conducted light-scattering dark-field microscopic imaging (iDFM) technique for real-time and in situ monitoring of the oxidative etching occurred on a single Ag nanocube was presented by using...
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