Thursday, May 07, 2015

Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy

TOC Graphic

The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.5b02197

Dawn Wood, Ian Hancox, Tim S. Jones and Neil R. Wilson
Click for full article
Posted by at
Labels: ,

No comments:

Post a Comment

Subscribe to: Post Comments (Atom)