Thursday, May 14, 2015

Nanoparticle characterization by means of scanning free grazing emission X-ray fluorescence

Nanoscale, 2015, 7,9320-9330
DOI: 10.1039/C5NR00791G, Paper
Yves Kayser, Jacinto Sa, Jakub Szlachetko
By means of scanning-free GEXRF the size and shapes of nanoparticles on the top of a substrate can accurately be differentiated.
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