Wednesday, May 06, 2015

Nanoparticle characterization by means of scanning free grazing emission X-ray fluorescence

Nanoscale, 2015, Advance Article
DOI: 10.1039/C5NR00791G, Paper
Yves Kayser, Jacinto Sa, Jakub Szlachetko
By means of scanning-free GEXRF the size and shapes of nanoparticles on the top of a substrate can accurately be differentiated.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry


Click for full article

No comments:

Post a Comment