Monday, May 11, 2015

Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films

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The Journal of Physical Chemistry C
DOI: 10.1021/acs.jpcc.5b01672

M. Trapatseli, D. Carta, A. Regoutz, A. Khiat, A. Serb, I. Gupta and T. Prodromakis
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