Microwave Near-Field Imaging of Two-Dimensional Semiconductors

Nano Letters

DOI: 10.1021/nl504960u

Samuel Berweger, Joel C. Weber, Jimmy John, Jesus M. Velazquez, Adam Pieterick, Norman A. Sanford, Albert V. Davydov, Bruce Brunschwig, Nathan S. Lewis, Thomas M. Wallis and Pavel Kabos

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