Monday, January 05, 2015

Determination of a refractive index and an extinction coefficient of standard production of CVD-graphene




Nanoscale , 2015, 7,1491-1500

DOI: 10.1039/C4NR06119E, Paper

Efrain Ochoa-Martinez, Mercedes Gabas, Laura Barrutia, Amaia Pesquera, Alba Centeno, Santiago Palanco, Amaia Zurutuza, Carlos Algora

Ellipsometry: a feasible method to determine the influence of contamination layers on the accurate optical response of mass produced graphene.

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