Nanoscale , 2015, 7,1491-1500
DOI: 10.1039/C4NR06119E, Paper
DOI: 10.1039/C4NR06119E, Paper
Efrain Ochoa-Martinez, Mercedes Gabas, Laura Barrutia, Amaia Pesquera, Alba Centeno, Santiago Palanco, Amaia Zurutuza, Carlos Algora
Ellipsometry: a feasible method to determine the influence of contamination layers on the accurate optical response of mass produced graphene.
The content of this RSS Feed (c) The Royal Society of Chemistry
Ellipsometry: a feasible method to determine the influence of contamination layers on the accurate optical response of mass produced graphene.
The content of this RSS Feed (c) The Royal Society of Chemistry
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