Monitoring Morphological Changes in 2D Monolayer Semiconductors Using Atom-Thick Plasmonic Nanocavities
ACS Nano
DOI: 10.1021/nn5064198
Daniel O. Sigle, Jan Mertens, Lars O. Herrmann, Richard W. Bowman, Sandrine Ithurria, Benoit Dubertret, Yumeng Shi, Hui Ying Yang, Christos Tserkezis, Javier Aizpurua and Jeremy J. Baumberg
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