Wednesday, December 17, 2014

Monitoring Morphological Changes in 2D Monolayer Semiconductors Using Atom-Thick Plasmonic Nanocavities

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ACS Nano

DOI: 10.1021/nn5064198




Daniel O. Sigle, Jan Mertens, Lars O. Herrmann, Richard W. Bowman, Sandrine Ithurria, Benoit Dubertret, Yumeng Shi, Hui Ying Yang, Christos Tserkezis, Javier Aizpurua and Jeremy J. Baumberg

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