Wednesday, December 17, 2014

In Situ TEM Characterization of Shear-Stress-Induced Interlayer Sliding in the Cross Section View of Molybdenum Disulfide

TOC Graphic


ACS Nano

DOI: 10.1021/nn506052d




Juan Pablo Oviedo, Santosh KC, Ning Lu, Jinguo Wang, Kyeongjae Cho, Robert M. Wallace and Moon J. Kim

Click for full article

No comments:

Post a Comment