Wednesday, November 05, 2014

Small angle X-ray scattering coupled with in situ electromechanical probing of nanoparticle-based resistive strain gauges




Nanoscale , 2014, Advance Article

DOI: 10.1039/C4NR04129A, Paper

Nicolas Decorde, Neralagatta M. Sangeetha, Benoit Viallet, Guillaume Viau, Jeremie Grisolia, Alessandro Coati, Alina Vlad, Yves Garreau, Laurence Ressier

SAXS/GISAXS, electromechanical tests and simulations on electronic conduction are carried out on gold nanoparticle-based strain gauges to unravel the mechanisms of deformation.

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