Nanoscale , 2014, Accepted Manuscript
DOI: 10.1039/C4NR02577F, Paper
DOI: 10.1039/C4NR02577F, Paper
David Moerman, Noham Sebaihi, Sreejith Embekkat Kaviyil, phil leclere, Roberto Lazzaroni, Olivier Douheret
In this work, conductive atomic force microscopy (C-AFM) is used to study the local electrical properties in thin films of self-organized fibrillate poly(3-hexylthiophene) (P3HT), as a reference polymer semiconductor. Depending...
The content of this RSS Feed (c) The Royal Society of Chemistry
In this work, conductive atomic force microscopy (C-AFM) is used to study the local electrical properties in thin films of self-organized fibrillate poly(3-hexylthiophene) (P3HT), as a reference polymer semiconductor. Depending...
The content of this RSS Feed (c) The Royal Society of Chemistry
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